SSTR

Measuring thermal properties becomes significantly more difficult as materials and devices shrink. Conventional techniques like laser flash or guarded hot plate work well for bulk samples, but they rely on assumptions that break down at...

Introduction As semiconductors continue to improve, thermal management becomes increasingly critical. Current semiconductor devices are certainly stronger, smaller, and higher in power densities than previously created devices. However, semiconductor performance deteriorates in the presence of...

In a significant boost for semiconductor research and development, Laser Thermal has announced a new collaboration with the National Institute of Standards and Technology (NIST). The Charlottesville-based company has been awarded a contract to supply...

Laser Thermal’s SSTR-F elevates the University of Maryland’s NEIT lab and beyond Laser Thermal has made significant strides in the thermal measurement field by using optical technologies to simplify and shorten the measurement process. This...

Unveiling Laser Thermal’s Innovative Solutions Thermal metrology plays a critical role in a wide variety of industries, from electronics to manufacturing, ensuring the reliability and efficiency of products. However, traditional thermal measurement practices can be...

In this blog, we provide an overview of thermal boundary resistance, why understanding it is critical when engineering semiconductor devices, some critical challenges for interfacial thermal metrology, and how thermal testing services can help. What...

A summary of some of the biggest trends for the semiconductor industry heading into 2023.

A summary of some of the biggest trends for the semiconductor industry heading into 2023.

Traditional thermal metrology techniques cannot be relied upon to generate reliable thermal resistance data for thin film materials.

Traditional thermal metrology techniques cannot be relied upon to generate reliable thermal resistance data for thin film materials.