FASTR – SSTR Mode – Thermal Conductivity Database
*Disclaimer: Because each material is process-dependent, properties will likely vary from these numbers. We recommend that you test to validate your assumptions.
| Sample | SSTR – value in W/m.k | Uncertainty (W/m.k) | Publication | Literature | Uncertainty | Measurement technique 7 notes | Notes |
|---|---|---|---|---|---|---|---|
| PCBM | 0.05 | 0.01 | Physical Review Materials 4, 065404, 2020 | 0.05 | 0.02 | TDTR, PPMS | Uncertainty based on spread in data from multiple prior papers: Physical Review Materials, 4:065404, 2020, Physical Review Letters, 110:015902, 2013, Physical Chemistry Chemical Physics, 18:1185–1190, 2015, Physical Review B, 88:075310, 2013 |
| a-SiO2 | 1.07 | 0.09 | Review of Scientific Instruments, 90, 024905 (2019) | 1.06 | 0.03 | Transient hot wire | Int. J. Thermophysics 26, 1595 (2005) |
| z-cut Quartz | 8.63 | 0.36 | Review of Scientific Instruments, 90, 024905 (2019) | 8.6 | TDTR | Rev. Sci. Instrum. 85, 104903 (2014) | |
| Sapphire | 35 | 1.4 | Review of Scientific Instruments, 90, 024905 (2019) | 34 | TDTR | Appl. Phys. Lett. 107, 203112 (2015) | |
| Silicon | 136 | 7 | Review of Scientific Instruments, 90, 024905 (2019) | 133 | TDTR | Appl. Phys. Lett. 107, 203112 (2015) | |
| GaN | 194 | 27 | Review of Scientific Instruments, 92, 064906 (2021) | 195 | Scanning thermal microscope | J. Appl. Phys. 88, 3295 (2000) | |
| AlN | 300 | 30 | ACS Applied Materials & Interfaces, 12, 29443 (2020) | 321 | 42 | TDTR | Phys. Rev. Mat. 4, 044602 (2020) |
| 4H-SiC | 335 | 28 | Review of Scientific Instruments, 90, 024905 (2019) | 364 | TDTR | Materials Today Physics 3, 70 (2017) | |
| Diamond | 2010 | 460 | Review of Scientific Instruments, 90, 024905 (2019) | 1900 | 500 | TDTR | Applied Physics Letters 111, 151902 (2017) |
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