On-Demand Webinar: Unlocking Thermal Measurements in Thin Films

June 4, 2026 Hans Olson
Webinar on thermal measurements in thin films
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Designing reliable thermal measurements in thin films and bonded interfaces

As power densities rise and material stacks grow more complex, thermal performance is increasingly governed by effects that conventional tools struggle to resolve. Directional heat flow, dominant interfacial resistance, and weak signal sensitivity leave real engineering questions unanswered.

Watch this on-demand session to see what becomes measurable when advanced thermal metrology is applied to real-world thin film and bonded systems. Using aluminum nitride as a working example, Hans Olson, VP of Product Development at Laser Thermal, walks through separating cross-plane from in-plane thermal conductivity, extracting thermal boundary resistance in multilayer stacks, and characterizing high-conductivity films and sub-10-micron bondlines that fall outside the reach of bulk steady-state or laser flash methods.

What you’ll learn

  • How to isolate film conductivity from the substrate and separate intrinsic material properties from interfacial effects
  • How to extract thermal boundary resistance across multilayer stacks and thin bondlines
  • How to measure high thermal conductivity materials despite small temperature gradients and low signal-to-noise
  • How anisotropy, multilayer architecture, and wafer-scale variation add complexity to measurement design

Who should watch

TIM developers, substrate engineers, advanced packaging engineers, materials R&D teams, and reliability engineers looking for deeper visibility into heat transport across thin, high-performance material systems.

Attendees will leave with a clearer path to reproducible workflows for directional thermal property extraction, reduced engineering risk in interface-dominated systems, and access to measurements that were previously out of reach.

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Contact us

Hans Olson

Hans Olson

Hans Olson leads the development of Laser Thermal’s thin-film and semiconductor wafer metrology platform, taking instruments from initial concept through to working tools that operate reliably in the field.
He earned his Ph.D. in Mechanical and Aerospace Engineering from the University of Virginia, where he conducted extensive research in the characterization of thermal properties of bulk and thin-film materials while building state-of-the-art optical measurement systems. He joined Laser Thermal directly following his PhD to lead the translation of the company’s core thermoreflectance method from academic prototype to commercial instrument.
At Laser Thermal, Hans owns the full development cycle across optical, mechanical, electrical, and software engineering. He leads product definition, system integration, and manufacturing, and works directly with customers through installation and training. His breadth across engineering disciplines allows Laser Thermal to bring measurement capabilities to market that are not only scientifically rigorous but practically deployable. He is passionate about developing tools that advance thermal conductivity measurements at both commercial and academic scales.
In his spare time, Hans enjoys climbing, fly fishing, and skiing.